ESR - Probability of detection (PoD) of material defects
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You will express the quality of CT measurements for material defect analysis in terms of probability of detection (POD). This POD depends highly on both the CT set-up and artefacts. Whereas the first constitutes rather global quality the latter is local due to local artefacts. You will start with the assessment of the POD for some typical defects in terms of local figures of merit. To establish this correlation a combination of the simulation tool ScorpiusXLab® and automatic defect inspection software will be used. This will result in a POD-map of the object. Besides, you will analyse the impact of artefacts on the POD. The targeted results can be used twofold: first, for a given inspection task, it can facilitate the acquisition strategy by moving the inspection tasks into good POD-regions. Second, the POD-map can be used for a quality dependent inspection software, which uses a fast algorithm in the good regions and a thorough one in degraded regions.
More info: www.interaqct.eu
Nr of positions available : 1
Engineering - Industrial engineering
Engineering - Precision engineering
Mathematics - Algorithms
Technology - Measurement technology
Technology - Production technology
Early stage researcher or 0-4 yrs (Post graduate)
First Stage Researcher (R1)
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FP7/People - Marie Curie Actions
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