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The analysis and the study of the processes of fabrication of electronic devices is of fundamental importance for the improvement of the electrical performance, for the study of the mechanisms of failure and reliability of the devices themselves.
In order to achieve these goals it is necessary to perform morphological, compositional, structural and electrical characterization in order to study materials and devices properties in order to correlate them to the process parameters.
The purpose of the research is aimed at the analysis of the manufacturing processes of semiconductor devices produced at Vishay semiconductor under the cooperation agreement in place with the DISAT.
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