Fellowship & Grant details

PhD position: Application and modelling of focused ion beams - study and simulation of material removal mechanisms

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*Study and simulation of material removal mechanisms in FIB (focused ion beam) processing*. The aim of the work is to model focused ion beam (FIB) material processing very fast by semi-analytical equations in order to allow real-time control of FIB systems with the desired structure shape as input and identify differences and commonalities with other energetic beam systems. So far, proper FIB modelling is typically based on extremely time-consuming Monte-Carlo simulations. After a review and com...

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Programme Description
Eligible destination country/ies for fellowsGermany
Eligibility of fellows: country/ies of residenceAll
Eligibility of fellows: nationality/iesAll
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Fellowship's Details
Career StageEarly stage researcher or 0-4 yrs (Post graduate), Experienced researcher or 4-10 yrs (Post-Doc)
Research ProfilesNot defined
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Funding organisation / Contacts
University of Erlangen-Nuremberg, Chair of Electron Devices