Fellowship & Grant details

PhD position: Application and modelling of focused ion beams - modelling of footprints obtained by FIB processing

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*Modelling of footprints obtained by FIB (focused ion beam) processing*. Based on the previous expertise developed at the University of Erlangen-Nuremberg, this project aims to understand and model accurately and efficiently how surface condition, material peculiarities (including re-deposited material and polycrystalline metals), and processing parameters affect the footprint of a focused ion beam (FIB) and identify specialties of FIB compared to footprints of other energetic beams. Finally, st...

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Research Fields


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Programme Description
Eligible destination country/ies for fellowsGermany
Eligibility of fellows: country/ies of residenceAll
Eligibility of fellows: nationality/iesAll
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Fellowship's Details
Career StageEarly stage researcher or 0-4 yrs (Post graduate), Experienced researcher or 4-10 yrs (Post-Doc)
Research ProfilesNot defined
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Funding organisation / Contacts
University of Erlangen-Nuremberg, Chair of Electron Devices